Volumetric Electron Microscopy

Volumetric Electron Microscopy (Volume EM) is an electron microscopy method used to generate 3D reconstructions of thick (>500 nm) samples. The initial role of electron microscopes in imaging two-dimensional slices (TEM) or a specimen surface (SEM with secondary electrons) has also increasingly expanded into the depth of samples. An early example of these volume EM workflows was simply to stack TEM images of serial sections cut through a sample. The next development was virtual reconstruction of a thick section (200-500 nm) volume by backprojection of a set of images taken at different tilt angles - TEM tomography.

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